ASTM D7084-2004(2009) 催化剂和催化剂载体的整体粉碎力的测定的标准试验方法

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【英文标准名称】:Connectorsforelectronicequipment-Part7-71:Detailspecificationfor8-way,shielded,freeandfixedconnectors,fordatatransmissionwithfrequenciesupto1000MHz(IEC60603-7-71:2010);GermanversionEN60603-7-71:2010
【原文标准名称】:电子设备用连接器.第7-71部分:数据传输频率1000MHz及以下的8路屏蔽的固定和自由连接器的详细规范(IEC60603-7-71-2010).德文版本EN60603-7-71-2010
【标准号】:DINEN60603-7-71-2011
【标准状态】:现行
【国别】:德国
【发布日期】:2011-06
【实施或试行日期】:2011-06-01
【发布单位】:德国标准化学会(DE-DIN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:反向兼容性;编织外壳;特性;电路网络;连接件;连接器的连接件;接触布局;串音衰减;阻尼(波);数据通信;数据传送;定义(术语);详细规范;数字工程;尺寸规格;直流电压;八极;电连接器;电插头;电气工程;电子工程;电子设备;电子设备及元件;架设(施工作业);评定;故障;固定式连接器;高速;信息处理;介入损耗;等容线;等距;低频;连接模式;网络;印制电路;印制电路板;性能;质量;质量评定;质量控制;额定值;编写;回程损耗;屏蔽的;防护屏蔽;通信;试验序列;试验程序;试验;传输特性;传输技术;类型
【英文主题词】:Backwardcompatibility;Braidshieldings;Characteristics;Circuitnetworks;Connections;Connectoredjoints;Contactconfiguration;Crosstalkattenuation;Damping;Datacommunication;Datatransfer;Definitions;Detailspecification;Digitalengineering;Dimensions;Directvoltage;Eight-pole;Electricconnectors;Electricplugs;Electricalengineering;Electronicengineering;Electronicequipment;Electronicequipmentandcomponents;Erecting(constructionoperation);Evaluations;Failure;Fixedconnectors;Highspeed;Informationprocessing;Insertionloss;Isometric;Isometry;Lowfrequencies;Modeofconnection;Network;Printedcircuits;Printed-circuitboards;Properties;Quality;Qualityassessment;Qualitycontrol;Ratings;Representations;Returnloss;Shielded;Shields;Telecommunication;Testgroup;Testprograms;Testing;Transmissioncharacteristics;Transmissiontechnique;Types
【摘要】:
【中国标准分类号】:L23
【国际标准分类号】:31_220_10
【页数】:21P;A4
【正文语种】:德语


【英文标准名称】:Semiconductordevices—Mechanicalandclimatictestmethods—Part37:Boardleveldroptestmethodusinganaccelerometer
【原文标准名称】:半导体装置.机械和气候试验方法.使用加速计的电路板级落锤试验方法
【标准号】:BSEN60749-37-2008
【标准状态】:现行
【国别】:英国
【发布日期】:2008-05-30
【实施或试行日期】:2008-05-30
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:加速测量仪;加速计;应用;壳体;气候;气候试验;组件;定义;设计;跌落试验;电气工程;电子的;电子设备及元件;故障分析;故障标准;仪器;机械工人;机械测试;印制电路板;半导体器件;半导体;标准化;测试
【英文主题词】:Accelerationmeasuringinstruments;Accelerometers;Applications;Bodies;Climatic;Climatictests;Components;Definition;Definitions;Design;Droptests;Electricalengineering;Electronic;Electronicequipmentandcomponents;Failureanalysis;Failurecriterion;Instruments;Mechanic;Mechanicaltesting;Printed-circuitboards;Semiconductordevices;Semiconductors;Standardizations;Testing
【摘要】:ThispartofIEC60749providesatestmethodthatisintendedtoevaluateandcomparedropperformanceofsurfacemountelectroniccomponentsforhandheldelectronicproductapplicationsinanacceleratedtestenvironment,whereexcessiveflexureofacircuitboardcausesproductfailure.Thepurposeistostandardizethetestboardandtestmethodologytoprovideareproducibleassessmentofthedroptestperformanceofsurface-mountedcomponentswhileproducingthesamefailuremodesnormallyobservedduringproductleveltest.Thepurposeofthisstandardistoprescribeastandardizedtestmethodandreportingprocedure.Thisisnotacomponentqualificationtestandisnotmeanttoreplaceanysystemleveldroptestthatmaybeneededtoqualifyaspecifichandheldelectronicproduct.ThestandardisnotmeanttocoverthedroptestrequiredtosimulateshippingandhandlingrelatedshockofelectroniccomponentsorPCBassemblies.TheserequirementsarealreadyaddressedintestmethodssuchasIEC60749-10.Themethodisapplicabletobothareaarrayandperimeter-leadedsurfacemountedpackages.Thistestmethodusesanaccelerometertomeasurethemechanicalshockdurationandmagnitudeappliedwhichisproportionaltothestressonagivencomponentmountedonastandardboard.ThetestmethoddescribedinthefutureIEC60749-401usesstraingaugetomeasurethestrainandstrainrateofaboardinthevicinityofacomponent.Thedetailedspecificationstateswhichtestmethodistobeused.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:22P.;A4
【正文语种】:英语